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Scanning Electron Microscope (SEM) Back to Mineral Characterisation Studies

A scanning electron microscope (SEM) is a type of electron microscope that produces high resolution images of surface of a sample by scanning it with a focused beam of electrons.
The instrument has two parts, the Scanning Electro Microscope (SEM) is the main instrument using for taking high resolution microphotogrphs in different mode e.g. SE, BSE, CL etcand Energy Dispersive X-Ray (EDX) is an attachment for qualitative and semi-quantitative microanalysis.

Standard Operating Procedure


  • The instrument has been using for taking images of microfossils, ultrastructure of surface morphology of grains, compositional images of different textures of polished rock.
  • A very useful tool for search of minute sized precious minerals like PGM, REE bearing minerals, etc.
  • SEM7 SEM8
    SEM6 SEM5

    Existing Locations:

    • NCEGR, Kolkata

      Additional Director General
      National Mission Head-IV
      Central Headquater
      Geological Survey of India
      15 A & B Kyd Street
      Fax- 033-22861716
      Email- hodm4@gsi.gov.in

    GSI,SR, Hyderabad

    Additional Director General & HOD
    Southern Region
    Geological Survey of India
    GSI Complex, Bandlaguda,
    Andhra Pradesh
    Email- hod.sr@gsi.gov.in

    GSI, CR, Nagpur

    Additional Director General & HOD
    Central Region
    Geological Survey of India
    GSI Complex, Seminary Hills,
    Nagpur-440006, Maharashtra
    Fax- 0712-2511671
    Email- hod.cr@gsi.gov.in
    For any feedback or issues, please write to ocbis.helpdesk@gsi.gov.in or call IP Phone 10013/10014, BSNL 033-2357-1775
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